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TCS launches AI-based solution to detect wafer anomaly in semiconductor manufacturing

India’s largest IT service provider Tata Consultancy Services (TCS) today announced the launch of TCS WaferWise, a cloud-based wafer anomaly detection solution to help chip makers digitally reimagine their product quality assurance process.

In a regulatory filing, TCS said that the solution was found by harnessing the company’s contextual knowledge of the semiconductor industry and the power of deep learning technology. 

”Sophisticated quality inspection of wafers during the semiconductor manufacturing process is essential to detect and classify defects early and accurately, as well as improve quality, TCS said adding,” several companies still run manual inspections that rely heavily on human expertise. This makes the process prone to errors, and limits manufacturing throughput.”

TCS WaferWise is a cloud-based solution that leverages custom AI models to automatically detect and classify anomalies by analyzing nano-scale images generated during the semiconductor manufacturing process. The solution runs on Google Cloud and utilizes TCS’ Continuous Learning Platform to effectively sample different datasets across multiple manufacturing lines and automatically trigger learning when required, steadily enhancing the accuracy of the AI model.

“TCS WaferWise is a transformative solution that we are deploying at the core of our customers’ manufacturing processes to improve product quality, drive up throughput, and meaningfully enhance their business growth,” V Rajanna, Global Head, Technology Business Unit, TCS was quoted in the statement. 

“Semiconductor companies, like all manufacturers, are looking to optimize processes, minimize costs and improve quality control,” said Victor Morales, Managing Director, Partnerships, Google Cloud. “We’re excited that this solution will bring together the combined strengths of Google Cloud and TCS to solve problems that are at the core of the semiconductor business.”

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